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Ho:YLF crystal case (1) – φ3×30 mm


Ho: YLFDimension: φ3*30mm

Process Indicators

  • Material: Ho:YLF Crystal
  • Dimension: φ3×30 mm
  • Orientation: a-cut
  • Doping: 1%
  • Coating: AR/AR@1900-2100 nm on both faces
  • Damage threshold: ˃10J/cm2@2050 nm, 10ns
  • Orientation Tolerence: < 0.5°
  • Thickness/Diameter Tolerance: ±0.1 mm
  • Surface Flatness: <λ/8@632 nm
  • Wavefront Distortion (WFD): <λ/4@632 nm
  • Surface Quality: 20/10
  • Parallel: 30〞
  • Perpendicular: 15ˊ
  • Clear Aperture: >90%
  • Chamfer: <0.2×45°



Ho YLF Φ3×30mm
Ho YLF Φ3×30mm
Jackie Dong

Jackie Dong

In photonic crystals, nanophotonics, negative refraction media, surface plasma optics, nonlinear optics and quantum optics, he has made many innovative achievements in theoretical and experimental research on electromaanetic field problems.

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