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Pr:YLF crystal case (2) – 3×3×5 mm for 522 nm laser

Requirements

Product

Specification/mm

0.5% Pr:YLF

3 x 3 x 5 mm

Process Indicators
  • Thickness/Diameter Tolerance ±0.10 mm
  • Surface Quality 40/20
  • Parallel 1ˊ
  • Perpendicular 30ˊ
  • Clear Aperture >90%
  • Chamfer <0.2×45°
  • Direction A-cut
  • 2-side polishing 3 x 3 mm
  • Coating:
  • S1: HR@522 nm/AR@444 nm
  • S2: AR @522nm

Pictures

pr ylf case
pr ylf case
Jackie Dong

Jackie Dong

In photonic crystals, nanophotonics, negative refraction media, surface plasma optics, nonlinear optics and quantum optics, he has made many innovative achievements in theoretical and experimental research on electromaanetic field problems.

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